상 태 | 판매완료 |
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번 호 | 70158 |
제 목 | ZEISS EVO40 Electron microscope |
등 록 일 | 2020-06-12 오후 1:18:37 |
등 록 인 | Lee |
제품정보 |
Carl Zeiss AG - EVO® 40 Series Company Carl Zeiss AG Categories Microscopy : Electron: SEM Specifications Resolution 3.0 nm @ 30 kV (SE and W) 2.0 nm @ 30 kV (SE and LaB6) Acceleration Voltage 0.2 to 30 kV Magnification 7 to 1,000,000x Field of View 6 mm at the Analytical Working Distance (AWD) X-ray Analysis 8.5 mm AWD and 35° take-off angle OptiBeam® Modes Resolution, Depth, Analysis, Large Field Available Detectors SE in HV - Everhart-Thornley BSD in all modes - quadrant semiconductor diode Chamber 310 mm (Ø) x 220 mm (h) 5-Axes Motorised Specimen Stage X = 80 mm Y = 80 mm Z = 35 mm T = 0° -90° R = 360° (continuous) Stage control by mouse or joystick and controlpanel Image Processing Resolution: Up to 3072 x 2304 pixel Signal acquisition by integrating and averaging Image Display Single flicker-free XVGA monitor with SEM image displayed at 1024 x 768 pixel System Control SmartSEMTM** GUI operated by mouse and keyboard Multilingual CONCISE GUI Windows® XP operating system Utility requirements 100 - 240V, 50 or 60 Hz single phase No water cooling requirement |
가 격 | 문의 |
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