제품정보 (메이커/스펙/옵션/액세서리/장비상태 등) |
*The ITC55100STD is a single site 100A version of the industry standard series of ITC55100 testers. The ITC55100STD performs all the same tests as the ITC55100 system but has a single test port and a maximum drain current capability of 100A for improved price/performance in single DUT production testing applications.
Military Specifications: ITC55100 Testers Conform to MIL-STD-750, Method 3470 Output Energy Limits: 1 millijoule to 0.0049 * (VDD)2 joules in 1 millijoule steps (i.e., 50V = 12.375 joules, 100V = 49.5 joules, 150V = 111.375 joules) Output Current x Time No Limit (IT) Limit: RTF Test Increment to Failure: Increments ID or L with programmable inductive load box attached Current Sensor Scale Factor: 250 mV/Amp@ 0.1A to 40.0A, 25 mV/Amp @ 40.1A to 100A Current Sensor Type: Hall Effect Sensor Drain Current Range: 0.1 to 100 amperes in 0.1 ampere steps Drain Voltage Range: Plus or Minus (N- or P- Channel) 10 -150 volts in 1 volt steps Rated Drain-Source Avalanche 10 to 2500 volts in 1.0 volt steps Voltage Range: (BVDSS) Gate Pulse Voltage Range: Plus or minus (N- or P- channel) 2 - 20 volts in 1-volt steps Leakage Test Forced Voltage = 2V to Programmed Drain Voltage (max.) (Pre & Post Avalanche) I = 1.0 mA; Imax = 8.0 mA Solid State Power Switch: 100 amps Gate Drive Resistance: 25Ω (50Ω per Kelvin leg) Parameter Entry: Touch screen display on front panel. GPIB from host computer. Any entry or calculated parameter that produces an out-of-range value indicates the parameter to be changed and a Start Test cannot be initiated until the parameter error has been corrected. Waveform Capture & Analysis: Waveforms can be captured and viewed on the LCD front panel display or via GPIB. Outputs: One test output for testing N or P channel MOSFETs, IGBTs and single or dual diodes with optional RSF box
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